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| Year of Publication |
2017
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| Journal |
Science of Advanced Materials 9 (2), 199-205, 2017
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| Volume |
9
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| Number of Pages |
199–205
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| Download citation |
Publications
Correlation of structural, morphological, electrical and mechanical properties of TiN thin film at different substrate bias
Professor of Chemistry
Citation: 1.Correlation of structural, morphological, electrical and mechanical properties of TiN thin film at different substrate bias. Science of Advanced Materials 9 (2), 199-205, 2017. 2017;9:199–205.
In: Science of Advanced Materials 9 (2), 199-205, 2017
Published by: American Scientific Publishers , 2017
google Scholar link: https://scholar.google.com/citations?view_op=view_citation&hl=en&user=7vKliHMAA…
Cited by: 2