Citation: 1.Photoelectron Spectroscopy Measurements of the Valence Band Structures of C60 Thin Films on Single Crystal Silicon and Polycrystalline Copper. MRS Online Proceedings Library (OPL) 734, 2002. 2002.

In: MRS Online Proceedings Library (OPL) 734, 2002

Published by: B Ha, JH Rhee, Y Li, D Singh, SC Sharma , 2002

google Scholar link: https://scholar.google.com/citations?view_op=view_citation&hl=en&user=NLLkyOgAA…

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