Publications
2014
sosaid,
650,
Conference Paper,
,
Kanoun, A.-A., & Goumri-Said, S. (2014). Characterization of DGFET properties from multiscale modeling: Effects of oxide thickness and temperature. 1-5.
2014
Passively variable emittance device and method for making the same
ahendaoui,
973,
Journal Article,
,
Passively variable emittance device and method for making the same. (2014). US Patent 8,908,253, 2014.
2014
mbader,
245,
Journal Article,
,
Inter-and Intramolecular Interactions in Some Bromo-and Tricyanovinyl-Substituted Thiophenes and Ethylenedioxythiophenes. (2014). Crystal Growth & Design 14 (3), 916-922, 2014.
2014
Single Asperity Scratch Behaviour of Cast Stellite 6 Alloy
mgoosen,
582,
Journal Article,
,
Single Asperity Scratch Behaviour of Cast Stellite 6 Alloy. (2014). International Multidisciplinary Microscopy Congress, 61-72, 2014.
2014
sosaid,
650,
Book Chapter,
,
Theoretical Assessment of the Mechanical, Electronic, and Vibrational Properties of the Paramagnetic Insulating Cerium Dioxide and Investigation of Intrinsic Defects. (2014). In Handbook of Research on Nanoscience, Nanotechnology, and Advanced Materials (pp. 431–446). IGI Global.
2014
sosaid,
650,
Journal Article,
,
Exploring the optoelectronic structure and thermoelectricity of recent photoconductive chalcogenides compounds, CsCdInQ3 (Q = Se, Te). (2014). RSC Advances 5, 9455, 2014, 5, 9455–9461.
2014
sosaid,
650,
Conference Paper,
,
Kanoun, A.-A., & Goumri-Said, S. (2014). Characterization of DGFET properties from multiscale modeling: Effects of oxide thickness and temperature. 1-5.
2014
sosaid,
650,
Conference Paper,
,
Kanoun, A.-A., & Goumri-Said, S. (2014). Characterization of DGFET properties from multiscale modeling: Effects of oxide thickness and temperature. 1-5.
2014
sosaid,
650,
Conference Paper,
,
Kanoun, A.-A., & Goumri-Said, S. (2014). Characterization of DGFET properties from multiscale modeling: Effects of oxide thickness and temperature. 1-5.
2014
sosaid,
650,
Conference Paper,
,
Kanoun, A.-A., & Goumri-Said, S. (2014). Characterization of DGFET properties from multiscale modeling: Effects of oxide thickness and temperature. 1-5.